Invention Grant
- Patent Title: Detecting occurrence of abnormality
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Application No.: US14345415Application Date: 2012-07-27
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Publication No.: US09625354B2Publication Date: 2017-04-18
- Inventor: Tsuyoshi Ide , Tetsuro Morimura
- Applicant: Tsuyoshi Ide , Tetsuro Morimura
- Applicant Address: US KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: US KY Grand Cayman
- Agency: Scully Scott Murphy and Presser
- Agent Frank Digiglio
- Priority: JP2011-206087 20110921
- International Application: PCT/JP2012/069179 WO 20120727
- International Announcement: WO2013/042455 WO 20130328
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G01M99/00 ; G06Q10/00 ; G06Q10/06 ; G07C5/08

Abstract:
A method, apparatus and computer program for detecting occurrence of an anomaly. The method can exclude arbitrariness and objectively judge whether a variation of a physical quantity to be detected is abnormal or not even when an external environment is fluctuating. The method includes acquiring multiple primary measurement values from a measurement target. Further, calculating and a reference value for each of the multiple primary measurement values by optimal learning. The method further includes calculating a relationship matrix which indicates mutual relationships between the multiple secondary measurement values. Further the method includes calculating an anomaly score for each of the secondary measurement value which indicates the degree of the measurement target being abnormal. The anomaly score is calculated by comparing the secondary measurement value with a predictive value which is calculated based on the relationship matrix and other secondary measurement values.
Public/Granted literature
- US20140336985A1 DETECTING OCCURRENCE OF ABNORMALITY Public/Granted day:2014-11-13
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