Invention Grant
- Patent Title: Stage device and charged particle beam apparatus using the stage device
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Application No.: US14626041Application Date: 2015-02-19
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Publication No.: US09627173B2Publication Date: 2017-04-18
- Inventor: Hironori Ogawa , Masaki Mizuochi , Shuichi Nakagawa , Tsukasa Sugawara
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2014-037689 20140228
- Main IPC: H01J37/20
- IPC: H01J37/20 ; G01B9/02 ; G01N23/22 ; G01B15/00

Abstract:
To attain the above object, in the present invention, proposed are a stage apparatus including a sample stage that mounts a sample, a first position detection device that detects a position of the sample stage, a second position detection device that detects a position of the sample stage when the sample stage is positioned in a part of a stage movement range that the first position detection device is capable of detecting, and a control device that adjusts an offset amount of the first position detection device on the basis of a position detection result obtained by the second position detection device, and a charged particle beam apparatus using the stage apparatus.
Public/Granted literature
- US20150248991A1 Stage Device and Charged Particle Beam Apparatus Using the Stage Device Public/Granted day:2015-09-03
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