Invention Grant
- Patent Title: Charged particle beam drawing apparatus, information processing apparatus and pattern inspection apparatus
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Application No.: US14619281Application Date: 2015-02-11
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Publication No.: US09627178B2Publication Date: 2017-04-18
- Inventor: Kenichi Yasui
- Applicant: NuFlare Technology, Inc.
- Applicant Address: JP Yokohama
- Assignee: NuFlare Technology, Inc.
- Current Assignee: NuFlare Technology, Inc.
- Current Assignee Address: JP Yokohama
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-063639 20140326
- Main IPC: H01J37/30
- IPC: H01J37/30 ; H01J37/317

Abstract:
A charged particle beam drawing apparatus of an embodiment includes: a graphic information file for storing graphic information for each of elements (for example, patterns) at a level underlying an element (for example, a cell) at a particular level in hierarchically-structured drawing data which has elements at each level; and an attribute information file for storing attribute information to be given to each of the elements at the underlying level in association with information (for example, an index number) on the element at the particular level.
Public/Granted literature
- US09659745B2 Charged particle beam drawing apparatus, information processing apparatus and pattern inspection apparatus Public/Granted day:2017-05-23
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