A semiconductor device includes a fuse block configured to store repair information corresponding to a fail address, and output fuse data in a boot-up operation; a dummy mat formed in a predetermined region of a cell array, and configured to store the fuse data in the boot-up operation; and a repair latch block configured to store the fuse data in the boot-up operation, wherein the fuse data stored in the dummy mat are updated to and stored in the repair latch block in a refresh operation.