Invention Grant
- Patent Title: Methods of forming semiconductor devices including low-k dielectric layer
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Application No.: US14291670Application Date: 2014-05-30
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Publication No.: US09633836B2Publication Date: 2017-04-25
- Inventor: Sang-Hoon Ahn , Seung-Hyuk Choi , Kyu-Hee Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel, P.A.
- Priority: KR10-2013-0067948 20130613
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/768 ; H01L23/48 ; H01L23/522 ; H01L23/532

Abstract:
Methods of forming a dielectric layer are provided. The methods may include introducing oxygen radicals and organic silicon precursors into a chamber to form a preliminary dielectric layer on a substrate. Each of the organic silicon precursors may include a carbon bridge and a porogen such that the preliminary dielectric layer may include carbon bridges and porogens. The methods may also include removing at least some of the porogens from the preliminary dielectric layer to form a porous dielectric layer including the carbon bridges.
Public/Granted literature
- US20140370704A1 METHODS OF FORMING SEMICONDUCTOR DEVICES INCLUDING LOW-K DIELECTRIC LAYER Public/Granted day:2014-12-18
Information query
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