Invention Grant
- Patent Title: TSV formation
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Application No.: US14933583Application Date: 2015-11-05
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Publication No.: US09633929B2Publication Date: 2017-04-25
- Inventor: Ku-Feng Yang , Shin-Puu Jeng , Wen-Chih Chiou
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/532 ; H01L21/288 ; H01L21/768 ; H01L23/00

Abstract:
A device includes a substrate having a front side and a backside, the backside being opposite the front side. An isolation layer is disposed on the front side of the substrate, wherein first portions of isolation layer and the substrate are in physical contact. A through substrate via (TSV) extends from the front side to the backside of the substrate. An oxide liner is on a sidewall of the TSV. The oxide liner extends between second portions of the substrate and the isolation layer. A dielectric layer having a metal pad is disposed over the isolation layer on the front side of the substrate. The metal pad and the TSV are formed of a same material.
Public/Granted literature
- US20160056090A1 TSV Formation Public/Granted day:2016-02-25
Information query
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