A test adapter for an electronic product to be tested includes a support structure and a product stand supported on the support structure for the product. The product stand is supported to the support structure by a guide structure that controls the vertical movement of the product stand. The product stand is arranged with a direct or indirect pressing movement from above to be movable from a top position to its low position supported by the guide structure. The test adapter includes a retaining structure for retaining the product stand in the low position and for retaining a latch structure of the adapter in its locking position. The latch structure is arranged to lock the product to the product stand.