Invention Grant
- Patent Title: Measuring apparatus, measuring system, and measuring method
-
Application No.: US14293039Application Date: 2014-06-02
-
Publication No.: US09638575B2Publication Date: 2017-05-02
- Inventor: Yuji Yamanaka , Go Maruyama , Kensuke Masuda , Sho Nagai
- Applicant: Yuji Yamanaka , Go Maruyama , Kensuke Masuda , Sho Nagai
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-128523 20130619; JP2013-256076 20131211; JP2014-078733 20140407
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/51 ; G01J3/46 ; G01J3/52

Abstract:
A measuring apparatus and a measuring method are provided. The measuring apparatus includes an optical system to condense light, a light receiving device to receive light condensed by the optical system at a plurality of light receiving positions and convert the light into an electric signal, a plurality of optical band-pass filters arranged near a lens stop of the optical system, each of the optical band-pass filters having a different spectral transmittance, a lens array arranged between the optical system and the light receiving device, the lens array having a plurality of lenses each of which is arranged substantially in parallel with a two-dimensional surface of the light receiving device, and a correction unit to correct the electric signal for each one of the plurality of light receiving positions of the light receiving device. The measuring method is performed by the measuring apparatus.
Public/Granted literature
- US20140375994A1 MEASURING APPARATUS, MEASURING SYSTEM, AND MEASURING METHOD Public/Granted day:2014-12-25
Information query