Invention Grant
- Patent Title: Sample processing apparatus
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Application No.: US14578564Application Date: 2014-12-22
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Publication No.: US09638610B2Publication Date: 2017-05-02
- Inventor: Takaaki Nagai , Daigo Fukuma , Mitsuo Yamasaki , Noriyuki Nakanishi , Syunsuke Yao
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Mots Law, PLLC
- Priority: JP2013-272556 20131227
- Main IPC: G01N1/28
- IPC: G01N1/28 ; B01L3/00 ; B01L9/06 ; G01N35/02 ; G01N35/00 ; G01N35/04

Abstract:
Disclosed is a sample processing apparatus that comprises a rack with positions to hold sample tubes, the rack including a rack identification suited to a kind of sample tube, a rack set unit that accepts the rack in a detachable manner, a tube transfer unit with mechanical movement to grab and take out each sample tube from a rack held in the rack set unit, a rack detector comprising a sensor to detect the rack identification of the rack held in the rack set unit, and a controller that controls movement of the tube transfer unit based on a detection result of the rack detector.
Public/Granted literature
- US20150185119A1 SAMPLE PROCESSING APPARATUS Public/Granted day:2015-07-02
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