Invention Grant
- Patent Title: System for deforming and analyzing particles
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Application No.: US14802293Application Date: 2015-07-17
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Publication No.: US09638620B2Publication Date: 2017-05-02
- Inventor: Dino Di Carlo , Daniel R. Gossett , Henry T. K. Tse , Aram Chung
- Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Applicant Address: US CA Oakland
- Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Current Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Current Assignee Address: US CA Oakland
- Agency: Vista IP Law Group LLP
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N15/14 ; G01N33/50 ; G01N21/64 ; G01N15/00 ; G01N15/10

Abstract:
A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.
Public/Granted literature
- US20150355073A1 SYSTEM AND METHOD FOR DEFORMING AND ANALYZING PARTICLES Public/Granted day:2015-12-10
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