Invention Grant
- Patent Title: Gas analysis system and method
-
Application No.: US14837200Application Date: 2015-08-27
-
Publication No.: US09638628B2Publication Date: 2017-05-02
- Inventor: Nagapriya Kavoori Sethumadhavan , Samhitha Palanganda Poonacha, Jr. , David Peter Robinson
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Nitin N. Joshi
- Main IPC: G01N21/25
- IPC: G01N21/25 ; G01N21/31 ; G01N21/27

Abstract:
A gas analysis system and method filter different wavelengths of incident light using a variable light filter at different locations along a length of the variable light filter to form filtered light. The variable light filter is configured to be disposed between a light source generating plural different wavelengths of the incident light and a gas sample. Intensities of wavelengths of the filtered light are determined after the incident light generated by the light source passes through the variable light filter and the gas sample. The gas sample may be identified from among different potential gasses based on the intensity of the one or more wavelengths of the filtered light that is determined by the light detector.
Public/Granted literature
- US20170059476A1 GAS ANALYSIS SYSTEM AND METHOD Public/Granted day:2017-03-02
Information query