Invention Grant
- Patent Title: Analysis apparatus and analysis method
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Application No.: US14489141Application Date: 2014-09-17
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Publication No.: US09638709B2Publication Date: 2017-05-02
- Inventor: Takaaki Nagai , Yuichi Hamada , Masaharu Shibata
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe-Shi, Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-Shi, Hyogo
- Agency: Brinks Gilson & Lione
- Agent Eric D. Babych
- Priority: JP2008-057382 20080307; JP2008-057661 20080307; JP2008-057972 20080307; JP2008-058007 20080307; JP2008-058302 20080307
- Main IPC: G01N31/00
- IPC: G01N31/00 ; G01N35/02 ; G01N35/00 ; G01N35/04

Abstract:
This analysis apparatus includes a transporter transporting the specimens to the first measurement unit and the second measurement unit, and a control portion so controlling the transporter as to transport a first specimen container, stored in the rack, storing a first specimen to the first measurement unit and as to transport a second specimen container, stored in the rack along with the first specimen container, storing a second specimen to the second measurement unit.
Public/Granted literature
- US20150004640A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2015-01-01
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