- Patent Title: Highly efficient diagnostic methods for monolithic sensor systems
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Application No.: US14187564Application Date: 2014-02-24
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Publication No.: US09638762B2Publication Date: 2017-05-02
- Inventor: Wolfgang Scherr
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Schiff Hardin LLP
- Main IPC: G01B7/14
- IPC: G01B7/14 ; G01B7/30 ; G01R33/06 ; G01R33/00 ; G01R33/07 ; G01R33/09 ; G01D5/14

Abstract:
Embodiments relate to integrated circuit (IC) sensors and more particularly to IC sensor diagnostics using multiple (e.g., redundant) communication signal paths, wherein one or more of the communication signal paths can be diverse (e.g., in hardware, software or processing, an operating principle, or in some other way) from at least one other of the multiple communication signal paths. Embodiments can relate to a variety of sensor types, implementations and applications, including 3D magnetic field and other sensors.
Public/Granted literature
- US20150241523A1 HIGHLY EFFICIENT DIAGNOSTIC METHODS FOR MONOLITHIC SENSOR SYSTEMS Public/Granted day:2015-08-27
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