Invention Grant
- Patent Title: System and method for programming workpiece feature inspection operations for a coordinate measuring machine
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Application No.: US14133120Application Date: 2013-12-18
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Publication No.: US09639083B2Publication Date: 2017-05-02
- Inventor: Eric Yeh-Wei Tseo , Dahai Yu
- Applicant: Mitutoyo Corporation , Mitutoyo Europe GmbH
- Applicant Address: JP Kanagawa-ken
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa-ken
- Agency: Seed Intellectual Property Law Group LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G05B19/418

Abstract:
A system and method are provided for programming workpiece feature inspection operations for a coordinate measuring machine. An editing environment is operated to display a 3-dimensional workpiece representation comprising a first surface feature of a workpiece. A first feature surface sampling pattern is created having at least one pattern parameter adjusted to correspond to a first surface feature of the workpiece. A corresponding representation of the sampling pattern includes operative sampling pattern locations located proximate to the first surface feature. User operations in the GUI further adjust pattern parameters of the sampling pattern. The further adjustment of the pattern parameters simultaneously affects a plurality of the sampling pattern locations. The sampling pattern representation may include various types of operative and inoperative sampling pattern locations, which may be displayed in a manner that distinguishes them from one another, such as by being represented with different colors, shapes or patterns.
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