Invention Grant
- Patent Title: Systems and methods for flaw scan with interleaved sectors
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Application No.: US14954343Application Date: 2015-11-30
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Publication No.: US09640217B1Publication Date: 2017-05-02
- Inventor: Jefferson Singleton
- Applicant: Avago Technologies General IP (Singapore) Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
- Current Assignee: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
- Current Assignee Address: SG Singapore
- Agency: Sheridan Ross P.C.
- Main IPC: G11B5/09
- IPC: G11B5/09 ; G11B20/10 ; G11B5/02 ; G11B20/12
Abstract:
Systems and methods relating generally to determining flaws on a storage medium.
Information query
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