Invention Grant
- Patent Title: Multi-port memory cell
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Application No.: US15237183Application Date: 2016-08-15
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Publication No.: US09640251B2Publication Date: 2017-05-02
- Inventor: Hidehiro Fujiwara , Kao-Cheng Lin , Yen-Huei Chen , Hung-Jen Liao
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW
- Agency: Hauptman Ham, LLP
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C11/419 ; G11C5/02 ; G11C5/06 ; G11C8/16 ; G11C11/417 ; H01L23/535 ; H01L27/11 ; G11C7/22 ; G11C8/14

Abstract:
A circuit includes: a first word line; a second word line; and a memory cell. The memory cell includes: a first pass gate, between a transistor and a first data line (RBL), having a gate coupled to the first word line; the transistor having a drain coupled to the first pass gate, a source coupled to a reference node, and a gate coupled to a data node of the memory cell; and a second pass gate, between the data node and a second data line, having a gate coupled to the second word line. The first word line is configured to turn on the first pass gate. The second word line is configured to turn on the second pass gate after an elapse of a first delay.
Public/Granted literature
- US20160351252A1 MULTI-PORT MEMORY CELL Public/Granted day:2016-12-01
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