Invention Grant
- Patent Title: Method for fabricating a semiconductor structure
-
Application No.: US14835979Application Date: 2015-08-26
-
Publication No.: US09640394B2Publication Date: 2017-05-02
- Inventor: Daniele Caimi , Lukas Czornomaz , Jean Fompeyrine , Emanuele Uccelli
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agent Mercedes Hobson
- Priority: GB1415119.5 20140827
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/8258 ; H01L29/16 ; H01L29/20 ; H01L29/22 ; H01L21/306

Abstract:
Method for fabricating a semiconductor structure. The method includes: providing a crystalline silicon substrate; defining an opening in a dielectric layer on the crystalline silicon substrate, the opening having sidewalls and a bottom wherein the bottom corresponds to a surface of the crystalline silicon substrate; providing a confinement structure above the dielectric layer, thereby forming a confinement region between the confinement structure and the dielectric layer; and growing a crystalline compound semiconductor material in the confinement region thereby at least partially filling the confinement region. The present invention also provides an improved compound semiconductor structure and a device for fabricating such semiconductor structure.
Public/Granted literature
- US20160064284A1 METHOD FOR FABRICATING A SEMICONDUCTOR STRUCTURE Public/Granted day:2016-03-03
Information query
IPC分类: