• Patent Title: Method for the contact-free measurement of deformations of a surface of a measured object
  • Application No.: US12668462
    Application Date: 2008-07-01
  • Publication No.: US09644948B2
    Publication Date: 2017-05-09
  • Inventor: Bernhard Wieneke
  • Applicant: Bernhard Wieneke
  • Applicant Address: DE Goettingen
  • Assignee: LAVISION GMBH
  • Current Assignee: LAVISION GMBH
  • Current Assignee Address: DE Goettingen
  • Agent Gerald E. Hespos; Michael J. Porco; Matthew T. Hespos
  • Priority: DE102007037726 20070809
  • International Application: PCT/EP2008/005366 WO 20080701
  • International Announcement: WO2009/018881 WO 20090212
  • Main IPC: G06K9/00
  • IPC: G06K9/00 G01B11/16
Method for the contact-free measurement of deformations of a surface of a measured object
Abstract:
The invention relates to a method for the contact-free measurement of deformations of a surface of a object in which a series of individual images is captured in each of two time windows (T1, T2), wherein between every two individual image captures the image detector is displaced relative to the object and parallel to its detector surface by an optical offset of the size of a fraction of a pixel up to a few pixels, the individual images of the first time window (T1) are processed in pairs with the individual images of the second time window (T2) to produce a set of individual deformation fields (18) and an average of the individual deformation fields (18) is calculated as an output deformation field (20).
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