Invention Grant
- Patent Title: Testing element, testing apparatus, and testing system
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Application No.: US14113171Application Date: 2012-04-06
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Publication No.: US09644998B2Publication Date: 2017-05-09
- Inventor: Masaya Ogura
- Applicant: Masaya Ogura
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2011-100981 20110428
- International Application: PCT/JP2012/060089 WO 20120406
- International Announcement: WO2012/147536 WO 20121101
- Main IPC: B01L3/00
- IPC: B01L3/00 ; G01D18/00 ; G01N33/487 ; G01N35/00

Abstract:
Conventional laboratory tests require calibration before each test. This results in the need for a reagent for calibration before each test. Additionally, calibration takes a long time, and the total TAT (Turn Around Time) of a testing system increases. The testing system thus suffers from the difficulty of improving the testing efficiency. This invention, which has been made to solve the problem, provides a testing element for performing a laboratory test, wherein the testing element includes an information recording section at the surface of and/or inside the testing element, and the information recording section stores information on a characteristic of the testing element.
Public/Granted literature
- US20140052400A1 TESTING ELEMENT, TESTING APPARATUS, AND TESTING SYSTEM Public/Granted day:2014-02-20
Information query
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