Invention Grant
- Patent Title: Automatic analysis device
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Application No.: US14116177Application Date: 2012-05-09
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Publication No.: US09645160B2Publication Date: 2017-05-09
- Inventor: Sakuichiro Adachi , Tomonori Mimura , Hajime Yamazaki , Masaki Shiba
- Applicant: Sakuichiro Adachi , Tomonori Mimura , Hajime Yamazaki , Masaki Shiba
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-107837 20110513
- International Application: PCT/JP2012/003018 WO 20120509
- International Announcement: WO2012/157206 WO 20121122
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N21/51 ; G01N21/82 ; G01N21/47 ; G01N35/04

Abstract:
The automatic analysis device measures time sequential data on a scattered light amount as reaction process data, and quantitatively determines the concentration of an analyte from a change in light amount. The automatic analysis device has a function of selecting reaction process data to be used for quantitative determination from the reaction process data obtained by measurement using a plurality of light receivers at different angles. As a result of using this function, data is selected from the reaction process data obtained by measurement using the plurality of light receivers at different angles in accordance with the concentration of the analyte and whether the priority is given to high sensitivity in the case where sensitivity is prioritized or a dynamic range, and the result of the quantitative determination is displayed.
Public/Granted literature
- US20140140890A1 AUTOMATIC ANALYSIS DEVICE Public/Granted day:2014-05-22
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