Invention Grant
- Patent Title: Measurement apparatus and method with adaptive scan rate
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Application No.: US14841650Application Date: 2015-08-31
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Publication No.: US09645169B2Publication Date: 2017-05-09
- Inventor: Ah Jin Jo , Ju Suk Lee , Yong Sung Cho , Sang Han Chung , Sang-il Park
- Applicant: Park Systems Corp.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: PARK SYSTEMS CORPORATION
- Current Assignee: PARK SYSTEMS CORPORATION
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: Hauptman Ham, LLP
- Priority: KR10-2015-0078223 20150602
- Main IPC: G01Q10/04
- IPC: G01Q10/04 ; G01Q30/06 ; G01Q10/06

Abstract:
A measurement method in which a sensing unit acquires surface data of a measurement target while scanning the surface of the measurement target and at least one of the sensing unit and the measurement target is moved in order for the sensing unit to scan the surface along a plurality of fast scan lines on the surface of the measurement target, includes: a first step in which the sensing unit scans a surface along any one fast scan line of the plurality of fast scan lines to acquire the surface data along the any one fast scan line; and a second step in which the sensing unit acquires a surface data along a fast scan line most adjacent to the any one fast scan line while at least one of the sensing unit and the measurement target is moved along the most adjacent fast scan line, after the first step.
Public/Granted literature
- US20160356808A1 MEASUREMENT APPARATUS AND METHOD WITH ADAPTIVE SCAN RATE Public/Granted day:2016-12-08
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