Invention Grant
- Patent Title: Systems and methods for determining electrical properties using magnetic resonance imaging
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Application No.: US14095707Application Date: 2013-12-03
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Publication No.: US09645214B2Publication Date: 2017-05-09
- Inventor: Ileana Hancu , Selaka Bandara Bulumulla , Florian Wiesinger , Laura Irene Sacolick , Seung Kyun Lee
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Pabitra K. Chakrabarti
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01R33/48 ; G01R33/24

Abstract:
Systems and methods for determining electrical properties using Magnetic Resonance Imaging (MRI) are provided. One method includes applying an ultra-short echo time (TE) pulse sequence in a Magnetic Resonance Imaging (MRI) system and acquiring a complex B1+B1− quantity from an object following the application of the ultra-short TE pulse sequence, where B1+ is a complex amplitude of a transmit radio-frequency (RF) magnetic field and B1− is a complex amplitude of a receive RF magnetic field. The method also includes estimating, with a processor, one or more electrical properties of the object using the complex amplitudes of the transmit RF magnetic field and the receive RF magnetic field.
Public/Granted literature
- US20150153431A1 SYSTEMS AND METHODS FOR DETERMINING ELECTRICAL PROPERTIES USING MAGNETIC RESONANCE IMAGING Public/Granted day:2015-06-04
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