Invention Grant
- Patent Title: Determination of a measuring sequence for a magnetic resonance system
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Application No.: US13757446Application Date: 2013-02-01
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Publication No.: US09645216B2Publication Date: 2017-05-09
- Inventor: Björn Heismann , Mathias Nittka , Peter Speier , Aurélien Stalder
- Applicant: Björn Heismann , Mathias Nittka , Peter Speier , Aurélien Stalder
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Agency: Lempia Summerfield Katz LLC
- Priority: DE102012201630 20120203; DE102012203512 20120306
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01R33/54 ; G01R33/38 ; G01R33/385 ; G01R33/565

Abstract:
A method and a measuring-sequence-determining device for determining a measuring sequence for a magnetic resonance system based on at least one intra-repetition-interval time parameter are provided. During the determination of the measuring sequence in a gradient-optimization method, gradient-pulse parameters of the measuring sequence are automatically optimized to reduce at least one gradient-pulse-parameter maximum value. As a boundary condition in the gradient-optimization method, the intra-repetition-interval time parameter is kept constant at least within a specified tolerance value.
Public/Granted literature
- US20130200893A1 Determination of a Measuring Sequence for a Magnetic Resonance System Public/Granted day:2013-08-08
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