Method to extract photon depth-of interaction and arrival time within a positron emission tomography detector
Abstract:
A method for extracting photon depth-of-interaction of an incident photon in a crystal with a reflective coating optically coupled to all sides of the crystal, except for an opening, wherein a photodetector is optically coupled to the opening. A pulse shape of a photodetector output as a result of detection of scintillation photons from the crystal generated by the incident photon is measured, wherein the reflective coating optically coupled to all sides of the crystal, except for an opening optically coupled to the photodetector reflects the scintillation photons passing to all sides of the crystal, except for the opening optically coupled to the photodetector. The pulse shape is used to determine photon depth-of-interaction within the crystal.
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