Invention Grant
- Patent Title: Immersion exposure apparatus and device manufacturing method with measuring device to measure specific resistance of liquid
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Application No.: US13950338Application Date: 2013-07-25
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Publication No.: US09645505B2Publication Date: 2017-05-09
- Inventor: Kenichi Shiraishi
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2004-171115 20040609
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03B27/42

Abstract:
An exposure apparatus is capable of accurately performing an exposure process and a measurement process based on a liquid immersion method. The exposure apparatus, which forms a liquid immersion area of a liquid on an image surface side of a projection optical system, and exposes a substrate via the projection optical system and the liquid of the immersion area, includes a measuring device which measures at least one of a property and composition of the liquid for forming the liquid immersion area.
Public/Granted literature
- US20130335717A1 IMMERSION EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD WITH MEASURING DEVICE Public/Granted day:2013-12-19
Information query
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