Invention Grant
- Patent Title: Method and system for recharacterizing the storage density of a memory device or a portion thereof
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Application No.: US14321701Application Date: 2014-07-01
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Publication No.: US09645749B2Publication Date: 2017-05-09
- Inventor: Linh Tien Truong , Allen Samuels , Navneeth Kankani
- Applicant: SanDisk Enterprise IP LLC
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G11C11/56 ; G11C13/00 ; G11C16/34

Abstract:
A storage system includes a memory controller and a storage device with one or more memory devices, each with a plurality of memory portions. The memory controller determines an initial storage capacity for each of the one or more memory devices, where the one or more memory devices are configured in a first storage density. The memory controller detects a trigger condition as to at least one memory portion of a respective device of the one or more memory devices and, in response to detecting the trigger condition, recharacterizes the at least one memory portion of the respective memory device so as to be configured in a second storage density, where the at least one recharacterized memory portion of the respective memory device has a reduced storage capacity. After the recharacterizing, the memory controller determines a revised storage capacity for the respective memory device.
Public/Granted literature
- US20150347039A1 Method and System for Recharacterizing the Storage Density of a Memory Device or a Portion Thereof Public/Granted day:2015-12-03
Information query