Invention Grant
- Patent Title: Alignment systems and wafer bonding systems and methods
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Application No.: US13963741Application Date: 2013-08-09
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Publication No.: US09646860B2Publication Date: 2017-05-09
- Inventor: Xin-Hua Huang , Xiaomeng Chen , Ping-Yin Liu , Lan-Lin Chao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/68
- IPC: H01L21/68 ; H01L21/67 ; H01L23/00

Abstract:
Alignment systems, and wafer bonding alignment systems and methods are disclosed. In some embodiments, an alignment system for a wafer bonding system includes means for monitoring an alignment of a first wafer and a second wafer, and means for adjusting a position of the second wafer. The alignment system includes means for feeding back a relative position of the first wafer and the second wafer to the means for adjusting the position of the second wafer before and during a bonding process for the first wafer and the second wafer.
Public/Granted literature
- US20150044786A1 Alignment Systems and Wafer Bonding Systems and Methods Public/Granted day:2015-02-12
Information query
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