- Patent Title: Wafer temporary bonding method and thin wafer manufacturing method
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Application No.: US14979102Application Date: 2015-12-22
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Publication No.: US09646868B2Publication Date: 2017-05-09
- Inventor: Hiroyuki Yasuda , Michihiro Sugo , Shohei Tagami , Masahito Tanabe
- Applicant: Shin-Etsu Chemical Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2014-259813 20141224
- Main IPC: H01L21/683
- IPC: H01L21/683 ; C09J7/02 ; C09J183/04 ; B32B7/06 ; B32B7/12 ; B24B37/30 ; H01L21/304 ; H01L21/306

Abstract:
A method for temporarily bonding a wafer to a support via a temporary bonding arrangement is provided. The arrangement is a composite temporary adhesive layer consisting of a non-silicone thermoplastic resin layer (A) which is releasably bonded to the wafer, a thermosetting siloxane polymer layer (B) laid thereon, and a thermosetting siloxane-modified polymer layer (C) releasably bonded to the support. The method comprises the steps of providing a wafer laminate having a thermosetting silicone composition layer (B′) formed on the resin layer (A) which has been formed on the wafer, providing a support laminate having a siloxane-containing composition layer (C′) formed on the support, joining and heating layer (B′) and layer (C′) in vacuum for bonding and curing the layers together.
Public/Granted literature
- US20160189998A1 WAFER TEMPORARY BONDING METHOD AND THIN WAFER MANUFACTURING METHOD Public/Granted day:2016-06-30
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