Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US15067116Application Date: 2016-03-10
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Publication No.: US09646933B2Publication Date: 2017-05-09
- Inventor: Tatsuro Saito , Atsunobu Isobayashi , Akihiro Kajita , Tadashi Sakai
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2015-173173 20150902
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/532 ; H01L23/522 ; H01L21/768

Abstract:
According to one embodiment, a semiconductor device includes a first insulating layer on an underlying layer, a first trench formed in the first insulating layer, and a first graphene layer provided in the first trench. The first trench comprises a bottom surface on the underlying and two side surfaces joined to the bottom surface, formed into a U-shape. The first graphene layer has a stacked structure including a plurality of graphene sheets. The plurality of graphene sheets each include a depression in a central portion. Portions of the graphene sheets located in an edge of the first graphene layer are each extended upward, which is in a direction opposite to the bottom surface.
Public/Granted literature
- US20170062345A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2017-03-02
Information query
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