Invention Grant
- Patent Title: System and method for offset voltage calibration
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Application No.: US14920671Application Date: 2015-10-22
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Publication No.: US09647622B1Publication Date: 2017-05-09
- Inventor: Kent Jaeger , Zhihang Zhang , Matthew Miller , Ramesh Chadalawada
- Applicant: Futurewei Technologies, Inc.
- Applicant Address: US TX Plano
- Assignee: FUTUREWEI TECHNOLOGIES, INC.
- Current Assignee: FUTUREWEI TECHNOLOGIES, INC.
- Current Assignee Address: US TX Plano
- Agency: Slater Matsil, LLP
- Main IPC: H03G3/20
- IPC: H03G3/20 ; H03G3/30 ; H03F3/195 ; H04B1/40 ; H04B17/21

Abstract:
An embodiment method includes measuring, by a calibration device, a first output voltage of a variable gain amplifier (VGA) when the VGA is set at a first gain setting and measuring, by a calibration device, a second output voltage of the VGA when the VGA is set at a second gain setting different from the first gain setting. The method further includes calculating, by the calibration device, an offset voltage of a signal path including the VGA using the first output voltage and the second output voltage and calculating, by the calibration device, an internal offset voltage of the VGA using the first output voltage and the second output voltage.
Public/Granted literature
- US20170117861A1 System and Method for Offset Voltage Calibration Public/Granted day:2017-04-27
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