Invention Grant
- Patent Title: Backlash measurement device and backlash measurement method
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Application No.: US14440067Application Date: 2013-10-22
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Publication No.: US09651451B2Publication Date: 2017-05-16
- Inventor: Kazunari Inamori , Hideo Suzuki , Susumu Tanaka , Seiichiro Naka , Yuji Sezaki
- Applicant: HONDA MOTOR CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: HONDA MOTOR CO., LTD.
- Current Assignee: HONDA MOTOR CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2012-247360 20121109
- International Application: PCT/JP2013/078578 WO 20131022
- International Announcement: WO2014/073367 WO 20140515
- Main IPC: G01M15/00
- IPC: G01M15/00 ; G01M13/02 ; G01M13/04 ; G01B5/14 ; F16H57/12 ; F16H25/22

Abstract:
This backlash measurement device measures the backlash existing between a first part and a second part that is provided with: a left pressing piece (37L) and a right pressing piece (37R) that rotate together with the second part, that pass through the center of rotation (41), and that extend the same distance from the center of rotation; a left pressing mechanism (38L) that presses the left pressing piece and a right pressing mechanism (38R) that presses the right pressing piece; a displacement amount detection mechanism (39) that comes into contact with the right pressing piece and that measures the displacement amount of the left pressing piece and the displacement amount of the right pressing piece; and a calculation unit (49) that determines backlash on the basis of the left displacement amount and the right displacement amount detected by the displacement amount detection mechanism.
Public/Granted literature
- US20150260608A1 BACKLASH MEASUREMENT DEVICE AND BACKLASH MEASUREMENT METHOD Public/Granted day:2015-09-17
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