Invention Grant
- Patent Title: Voltage measuring apparatus with temperature abnormality detection function and power conversion apparatus
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Application No.: US14764399Application Date: 2014-01-24
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Publication No.: US09651510B2Publication Date: 2017-05-16
- Inventor: Ryouji Hironaka
- Applicant: Ryouji Hironaka
- Applicant Address: JP Toyota-shi, Aichi-ken
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota-shi, Aichi-ken
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-018454 20130201
- International Application: PCT/IB2014/000179 WO 20140124
- International Announcement: WO2014/118625 WO 20140807
- Main IPC: H02P1/00
- IPC: H02P1/00 ; G01N25/72 ; H02M1/32 ; G01K3/00 ; G01K7/22 ; H02H7/12 ; H02M7/537 ; H02P27/06

Abstract:
A voltage measuring apparatus is configured to measure voltage between a positive terminal and a negative terminal of a device, and the voltage measuring apparatus includes: a PTC thermistor that is connected to one of terminals of the device; and a measuring circuit that measures voltage of one of the terminals through the PTC thermistor with respect to a specified reference potential and voltage of the other of the terminals with respect to the reference potential. The voltage measuring apparatus detects temperature abnormality of the device or components associated with the device.
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