Invention Grant
- Patent Title: Method and apparatus for scanning an object
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Application No.: US14315901Application Date: 2014-06-26
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Publication No.: US09651525B2Publication Date: 2017-05-16
- Inventor: Nicolas Grimard , Rene Sicard , Sam H. Serhan
- Applicant: TecScan Systems Inc.
- Applicant Address: CA Boucherville, Quebec
- Assignee: TECSCAN SYSTEMS INC.
- Current Assignee: TECSCAN SYSTEMS INC.
- Current Assignee Address: CA Boucherville, Quebec
- Agency: BCF LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N29/265

Abstract:
The present disclosure relates to a method and an apparatus for scanning an object. Two virtual, orthogonal axes are positioned on a surface of the object. A scanning path of a moving probe is controlled as a function of the two virtual, orthogonal axes. The scanning path can include a plurality of probe positions determined according to a desired coverage of the object. A single probe can be used or, optionally, a pair of probes or an array of probes can be used, optionally mounting the probes on a multi-axis movable support. Optionally, a computer-aided design representing the object can be used to parameterize the object. The method and apparatus can be used to create an image of the object for non-destructive testing.
Public/Granted literature
- US20150000410A1 METHOD AND APPARATUS FOR SCANNING AN OBJECT Public/Granted day:2015-01-01
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