Invention Grant
- Patent Title: Integrated circuit device for impedance measurement
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Application No.: US14645222Application Date: 2015-03-11
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Publication No.: US09651582B2Publication Date: 2017-05-16
- Inventor: Anton Salfelner
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Agent Rajeev Madnawat
- Main IPC: G01R27/02
- IPC: G01R27/02 ; G01R17/02 ; G01R27/04 ; H03H7/40 ; H04B1/04 ; H04B1/18

Abstract:
A system for measuring impedance is disclosed. The system is designed to be connected with an external unknown impedance. The system includes a reference signal generator, an impedance component coupled to the reference signal generator, a local oscillator configured to generate a signal of a selected frequency, a plurality of frequency mixers coupled to the impedance component and the local oscillator and a switch connected across the impedance component in such a way that the impedance component is bypassed when the switch is on.
Public/Granted literature
- US20160266173A1 IMPEDANCE MEASUREMENT Public/Granted day:2016-09-15
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