Invention Grant
- Patent Title: Impedance detector apparatus and method
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Application No.: US14095169Application Date: 2013-12-03
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Publication No.: US09651592B2Publication Date: 2017-05-16
- Inventor: Russel J. Kerkman , Ahmed Mohamed Sayed Ahmed , Brian J. Seibel , Shiv Gupta , Prathamesh Ramesh Vadhavkar
- Applicant: Russel J. Kerkman , Ahmed Mohamed Sayed Ahmed , Brian J. Seibel , Shiv Gupta , Prathamesh Ramesh Vadhavkar
- Applicant Address: US OH Mayfield Heights
- Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee Address: US OH Mayfield Heights
- Agency: Fay Sharpe LLP
- Main IPC: G01R27/02
- IPC: G01R27/02 ; G01R27/08 ; G01R31/02 ; G01R31/42
Abstract:
Impedance detection methods and systems are presented for automatic computation of an electrical component impedance value at one or more specific frequencies of interest using quadrature voltage and current values generated by quadrature tracking filters based on sensed or measured voltage and current signals or values and a base frequency input.
Public/Granted literature
- US20150153397A1 IMPEDANCE DETECTOR APPARATUS AND METHOD Public/Granted day:2015-06-04
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