A semiconductor circuit having a test function includes: a first circuit block including a circuit for performing a main function of the semiconductor circuit; a first power control block for controlling supply of power to the first circuit block; a second circuit block including a circuit for performing a function of testing the semiconductor circuit; and a second power control block for controlling supply of power to the second circuit block. The semiconductor circuit is operable in a first power mode in which a first pad is supplied with a supply voltage and a second pad is grounded, or in a second power mode in which the second pad is supplied with the supply voltage and the first pad is grounded. The second power control block is implemented as a diode.