Invention Grant
- Patent Title: Isometric test compression with low toggling activity
-
Application No.: US14642501Application Date: 2015-03-09
-
Publication No.: US09651622B2Publication Date: 2017-05-16
- Inventor: Janusz Rajski , Amit Kumar , Mark A. Kassab , Elham Moghaddam , Nilanjan Mukherjee , Jerzy Tyszer , Chen Wang
- Applicant: Mentor Graphics Corporation
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Banner & Witcoff, Ltd.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3183 ; G01R31/3185
Abstract:
Various aspects of the disclosed technology relate to techniques of creating test templates for test pattern generation. Residual test cubes for a plurality of faults are first generated based on a signal probability analysis of a circuit design. Test templates are then generated based on merging the residual test cubes. Finally, a plurality of test patterns and/or compressed test cubes are generated based on one of the test templates.
Public/Granted literature
- US20150253385A1 Isometric Test Compression With Low Toggling Activity Public/Granted day:2015-09-10
Information query
