Invention Grant
- Patent Title: Electric capacity measurement apparatus with temperature compensation and temperature compensation method thereof
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Application No.: US14741478Application Date: 2015-06-17
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Publication No.: US09651626B2Publication Date: 2017-05-16
- Inventor: Kuo-Liang Teng , Jih-Liang Juang
- Applicant: uPI Semiconductor Corp.
- Applicant Address: TW Hsinchu County
- Assignee: uPI Semiconductor Corp.
- Current Assignee: uPI Semiconductor Corp.
- Current Assignee Address: TW Hsinchu County
- Agency: Jianq Chyun IP Office
- Priority: TW103140241A 20141120
- Main IPC: G01N27/416
- IPC: G01N27/416 ; G01R31/36

Abstract:
An electric capacity measurement apparatus with temperature compensation and a temperature compensation method thereof are provided. The electric capacity measurement apparatus includes an electric capacity measurement circuit, a non-volatile memory, a temperature measurement circuit and a control circuit. The electric capacity measurement circuit is configured to obtain an input current signal and compensate the input current signal according to a present invalid current range or a present zero current offset to obtain an electric capacity signal. The non-volatile memory is configured to store a plurality of test parameters at different temperatures related to the electric capacity measurement circuit in a test stage. The temperature measurement circuit measures a present temperature value of the electric capacity measurement circuit in an operation stage. The control circuit generates a present invalid current range or a present zero current offset according to the present temperature value and the plurality of test parameters.
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