Invention Grant
- Patent Title: Gamma ray spectroscopy monitoring method and apparatus
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Application No.: US13774439Application Date: 2013-02-22
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Publication No.: US09651680B2Publication Date: 2017-05-16
- Inventor: William R Stagg , Timothy A Policke
- Applicant: Babcock & Wilcox Technical Services Group, Inc.
- Applicant Address: US VA Lynchburg
- Assignee: BWXT Technical Services Group, Inc.
- Current Assignee: BWXT Technical Services Group, Inc.
- Current Assignee Address: US VA Lynchburg
- Agency: Nelson Mullins Riley & Scarborough, LLP
- Main IPC: G01T1/167
- IPC: G01T1/167 ; G01T7/02

Abstract:
The present invention relates generally to the field of gamma ray spectroscopy monitoring and a system for accomplishing same to monitor one or more aspects of various isotope production processes. In one embodiment, the present invention relates to a monitoring system, and method of utilizing same, for monitoring one or more aspects of an isotope production process where the monitoring system comprises: (A) at least one sample cell; (B) at least one measuring port; (C) at least one adjustable collimator device; (D) at least one shutter; and (E) at least one high resolution gamma ray spectrometer.
Public/Granted literature
- US20140131584A1 GAMMA RAY SPECTROSCOPY MONITORING METHOD AND APPARATUS Public/Granted day:2014-05-15
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