Invention Grant
- Patent Title: Measurement apparatus, lithography apparatus, and article manufacturing method
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Application No.: US14718506Application Date: 2015-05-21
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Publication No.: US09651876B2Publication Date: 2017-05-16
- Inventor: Kenji Noda
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2014-109429 20140527
- Main IPC: G03B27/62
- IPC: G03B27/62 ; G03F7/20 ; G01B11/00

Abstract:
A measurement apparatus includes: an imaging unit positioned with fixing with respect to a first member; a first detector configured to detect a position of a stage with reference to a second member; a second detector configured to detect fluctuation of a position of the first member with reference to the second member; and a control unit configured to obtain the position of the mark from an image of the mark sensed by the imaging unit while controlling a relative position of the stage relative to the second member so as to reduce fluctuation of a relative position of the mark relative to the imaging unit due to the fluctuation of the position of the first member based on detection results of the first and second detectors.
Public/Granted literature
- US20150346611A1 MEASUREMENT APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD Public/Granted day:2015-12-03
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