Invention Grant
- Patent Title: Multi-core RAM error detection and correction (EDAC) test
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Application No.: US14805229Application Date: 2015-07-21
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Publication No.: US09652315B1Publication Date: 2017-05-16
- Inventor: Lloyd F. Aquino , John L. Hagen , Todd E. Miller , Branden H. Sletteland
- Applicant: Lloyd F. Aquino , John L. Hagen , Todd E. Miller , Branden H. Sletteland
- Applicant Address: US IA Cedar Rapids
- Assignee: Rockwell Collins, Inc.
- Current Assignee: Rockwell Collins, Inc.
- Current Assignee Address: US IA Cedar Rapids
- Agent Angel N. Gerdzhikov; Donna P. Suchy; Daniel M. Barbieri
- Main IPC: G06F11/10
- IPC: G06F11/10 ; H03M13/00 ; G06F11/07 ; G06F3/06

Abstract:
A system and method for detection and correction of single-bit errors in a multi-core processing resource (MCPR) of an avionics processing system includes a RAM EDAC testing module called by the MCPR health monitor to access EDAC registers of a system-on-chip module coupled to the MCPR and access memory addresses passed by the MCPR health monitor to detect single-bit errors. Single-bit errors detected in memory mapped to the hypervisor are corrected by the RAM EDAC testing module. Single-bit errors detected in memory associated with a partition or core of the MCPR are corrected by the health monitor running on the particular partition or core with which the memory portion is associated. Single-bit errors may be detected in unmapped memory associated with a partition or core by accessing the unmapped memory via a temporary TLB entry.
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