Invention Grant
- Patent Title: Object detection apparatus detection method and program
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Application No.: US14130093Application Date: 2012-06-29
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Publication No.: US09652857B2Publication Date: 2017-05-16
- Inventor: Hiroo Ikeda
- Applicant: Hiroo Ikeda
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wilmer Cutler Pickering Hale and Dorr LLP
- Priority: JP2011-147289 20110701
- International Application: PCT/JP2012/067251 WO 20120629
- International Announcement: WO2013/005815 WO 20130110
- Main IPC: G06T7/136
- IPC: G06T7/136 ; G06K9/00 ; G06T7/50

Abstract:
An object detection apparatus acquires the value of an overlapping area which indicates a high probability that an object is located within a three dimensional space using data including a back projection of an object area on a three-dimensional space, acquires the integral quantity of the value of the overlapping area in a shape model including a three-dimensional target, and acquires the distribution degree of the value of the overlapping area in the shape model of the detection target. The apparatus further determines whether the inside of the shape model is an object or non-object using the integral quantity and the distribution degree.
Public/Granted literature
- US20140140576A1 OBJECT DETECTION APPARATUS DETECTION METHOD AND PROGRAM Public/Granted day:2014-05-22
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