Invention Grant
- Patent Title: Method of measuring beam position of multi charged particle beam, and multi charged particle beam writing apparatus
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Application No.: US14823015Application Date: 2015-08-11
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Publication No.: US09653262B2Publication Date: 2017-05-16
- Inventor: Osamu Iizuka , Kenji Ohtoshi
- Applicant: NuFlare Technology, Inc.
- Applicant Address: JP Yokohama
- Assignee: NuFlare Technology, Inc.
- Current Assignee: NuFlare Technology, Inc.
- Current Assignee Address: JP Yokohama
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-191659 20140919
- Main IPC: H01J37/04
- IPC: H01J37/04 ; H01L21/027 ; H01J37/317 ; H01J37/304

Abstract:
A method of measuring beam positions of multi charged particle beams includes acquiring a number of multi charged particle beams needed for the measurement reproducibility of a current amount to be within the range of an allowable value. The method further includes setting measurement points depending on a desired dimensional accuracy value in an irradiation region irradiated by the whole of the multi charged particle beams, and setting, for each of a plurality of measurement points, a beam region, including a measurement point of measurement points irradiated by a plurality of beams whose number is the number of beams needed for the measurement reproducibility in the multi charged particle beams. Further, the method includes measuring, for each of a plurality of measurement points, the position of a measurement point concerned in a plurality of measurement points by using a plurality of beams of a corresponding beam region.
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