Invention Grant
- Patent Title: Method of manufacturing semiconductor device
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Application No.: US15273067Application Date: 2016-09-22
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Publication No.: US09653351B2Publication Date: 2017-05-16
- Inventor: Arito Ogawa , Atsuro Seino
- Applicant: HITACHI KOKUSAI ELECTRIC INC.
- Applicant Address: JP Tokyo
- Assignee: HITACHI KOKUSAI ELECTRIC INC.
- Current Assignee: HITACHI KOKUSAI ELECTRIC INC.
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L21/44 ; H01L21/768 ; H01L21/285 ; C23C16/34 ; C23C16/14 ; C23C16/455

Abstract:
A method of manufacturing a semiconductor device may include: (a) loading a substrate into a process chamber, the substrate having: a process surface provided with a first metal film containing at least a first metal element; (b) forming a second metal film on the substrate loaded in the process chamber by alternately supplying a metal compound and a first reactive gas reactive with the metal compound to the substrate a plurality of times; (c) alternately performing steps (c-1) and (c-2) a plurality of times wherein the step (c-1) includes: forming an amorphous third metal film on the second metal film, and the step (c-2) includes: forming a fourth metal film on the third metal film; and (d) forming an amorphous fifth metal film on the fourth metal film by supplying the metal compound mixed with the second reactive gas to the substrate.
Public/Granted literature
- US20170011958A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2017-01-12
Information query
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