Invention Grant
- Patent Title: Method for testing tunable wavelength laser device and tunable wavelength laser device
-
Application No.: US14527699Application Date: 2014-10-29
-
Publication No.: US09653881B2Publication Date: 2017-05-16
- Inventor: Eiichi Banno
- Applicant: Sumitomo Electric Industries, Ltd.
- Applicant Address: JP Osaka-shi
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi
- Agency: Venable LLP
- Agent Michael A. Sartori; Laura G. Remus
- Priority: JP2013-226020 20131030
- Main IPC: H01S5/06
- IPC: H01S5/06 ; H01S5/00 ; H01S5/026 ; H01S5/0625 ; H01S5/12

Abstract:
A method for testing a tunable wavelength laser device, which can suppress any error of light transmission characteristics of an etalon, and a tunable wavelength laser device are provided. The method for testing a tunable wavelength laser device is a method for testing a tunable wavelength laser device including a tunable wavelength laser and a wavelength sensing unit having an etalon. The testing method includes a first step of measuring a free spectral range interval of the etalon, a second step of acquiring a driving condition by tuning a wavelength to a target value provided between a top and a bottom of the free spectral range interval, and a third step of storing the driving condition in a memory.
Public/Granted literature
- US20150117478A1 METHOD FOR TESTING TUNABLE WAVELENGTH LASER DEVICE AND TUNABLE WAVELENGTH LASER DEVICE Public/Granted day:2015-04-30
Information query