Invention Grant
- Patent Title: System and method for testing
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Application No.: US14655074Application Date: 2013-11-17
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Publication No.: US09654890B2Publication Date: 2017-05-16
- Inventor: Eric Andreas Haber , Yuval Cohen , Shay Kaplan , Daniel Lewin , Meir Ben Simon
- Applicant: AUDIO PIXELS LTD.
- Applicant Address: IL Rehovot
- Assignee: AUDIO PIXELS LTD.
- Current Assignee: AUDIO PIXELS LTD.
- Current Assignee Address: IL Rehovot
- Agency: Browdy and Neimark, PLLC
- International Application: PCT/IL2013/050951 WO 20131117
- International Announcement: WO2014/102766 WO 20140703
- Main IPC: H04R29/00
- IPC: H04R29/00 ; H04R1/00

Abstract:
The present disclosure provides a method for testing an apparatus which comprises a set of operational subunits each comprising a moving element, wherein the moving elements move between respective first and second extreme positions, the method comprising: transferring to the apparatus stabilization control commands; transferring to the apparatus first latching-commands for latching to the first extreme position a candidate moving element which is a moving element of a candidate operational subunit; when the first latching control commands are in effect, measuring a first output frequency of an oscillator whose output is coupled to the candidate operational subunit in an electrical coupling setup which causes the output frequency of the oscillator to depend on positions of a plurality of moving elements which comprises the candidate moving element; and based on the first output frequency determining a state of the candidate operational subunit.
Public/Granted literature
- US20150350800A1 SYSTEM AND METHOD FOR TESTING Public/Granted day:2015-12-03
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