Invention Grant
- Patent Title: Microbolometer contact systems and methods
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Application No.: US14709383Application Date: 2015-05-11
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Publication No.: US09658111B2Publication Date: 2017-05-23
- Inventor: Eric A. Kurth , Patrick Franklin
- Applicant: FLIR Systems, Inc.
- Applicant Address: US OR Wilsonville
- Assignee: FLIR Systems, Inc.
- Current Assignee: FLIR Systems, Inc.
- Current Assignee Address: US OR Wilsonville
- Agency: Haynes and Boone, LLP
- Main IPC: H01L31/02
- IPC: H01L31/02 ; G01J5/20 ; C25D5/02 ; G01J5/02 ; C25D1/00 ; G01J5/00

Abstract:
Systems and methods are directed to contacts for an infrared detector. For example, an infrared imaging device includes a substrate having a first metal layer and an infrared detector array coupled to the substrate via a plurality of contacts. Each contact includes for an embodiment a plurality of metal studs each having a first end and a second end and each disposed between the first metal layer and a second metal layer, wherein the first end of each metal stud is disposed on a portion of the first metal layer that is at least partially on the surface of the substrate.
Public/Granted literature
- US20150247758A1 MICROBOLOMETER CONTACT SYSTEMS AND METHODS Public/Granted day:2015-09-03
Information query
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