Invention Grant
- Patent Title: Method for detecting heat generation points and device for detecting heat generate points
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Application No.: US14355596Application Date: 2012-08-31
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Publication No.: US09658116B2Publication Date: 2017-05-23
- Inventor: Tomonori Nakamura
- Applicant: Tomonori Nakamura
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2011-243891 20111107
- International Application: PCT/JP2012/072223 WO 20120831
- International Announcement: WO2013/069362 WO 20130516
- Main IPC: G01K17/00
- IPC: G01K17/00 ; G01K13/00 ; G01N25/72 ; G01R31/28 ; G01R31/311

Abstract:
A heat generation point detection method comprises: step of stabilizing an average temperature of a surface of an integrated circuit S; steps of applying a bias voltage of a low frequency to the integrated circuit S and acquiring a heat generation detection signal detected from the integrated circuit S in response thereto; steps of supplying a bias voltage of a high frequency and acquiring a heat generation detection signal detected in response thereto; steps of detecting a phase shift between the bias voltage of the low frequency and the heat generation detection signal and a phase shift between the bias voltage of the high frequency and the heat generation detection signal; and step of calculating a change rate of the phase shift against a square root of the frequency of the bias voltage, and obtaining depth information of the heat generation point from the change rate.
Public/Granted literature
- US20140294038A1 METHOD FOR DETECTING HEAT GENERATION POINTS AND DEVICE FOR DETECTING HEAT GENERATE POINTS Public/Granted day:2014-10-02
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