Invention Grant
- Patent Title: Alternating current coupled electronic component test system and method
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Application No.: US15207351Application Date: 2016-07-11
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Publication No.: US09658288B2Publication Date: 2017-05-23
- Inventor: Bharani Thiruvengadam , Akira Kakizawa
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/28

Abstract:
This disclosure relates generally to an electrical circuit and method. A capacitive element can be configured to be coupled in series with an electronic package component. A path resistance can be electrically coupled to the capacitive element. A driver can be configured to electrically charge the capacitive element. A voltage detector can be coupled to the capacitive element and configured to identify a condition of the electronic package component based on a measured voltage of the capacitive element.
Public/Granted literature
- US20160320447A1 ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND METHOD Public/Granted day:2016-11-03
Information query
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