Invention Grant
- Patent Title: Testing a switched mode supply with waveform generator and capture channel
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Application No.: US13289671Application Date: 2011-11-04
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Publication No.: US09658294B2Publication Date: 2017-05-23
- Inventor: Stefano Pietri , Chris C. Dao , Garrin S. Felber
- Applicant: Stefano Pietri , Chris C. Dao , Garrin S. Felber
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: G01R21/00
- IPC: G01R21/00 ; G01R31/40 ; H02M3/156
Abstract:
A test method and system are provided for testing a switched mode power supply in open loop on an automated test equipment device by applying a low frequency waveform signal (209) to a compensator filter (225) and simultaneously capturing and processing the input (223) and output (222) to the compensator filter (225) to determine the phase difference therebetween.
Public/Granted literature
- US20130113449A1 Testing a Switched Mode Supply with Waveform Generator and Capture Channel Public/Granted day:2013-05-09
Information query
